diffractometer中文,diffractometer的意思,diffractometer翻译及用法

2026-05-06 01:48 浏览次数 23

diffractometer

英[dɪfræk'tɒmɪtə(r)]美[dɪfræk'tɒmɪtə(r)]

n. [光] 衍射计

diffractometer 英语释义

英语释义

    1. an instrument for analyzing the structure of a usually crystalline substance from the scattering pattern produced when a beam of radiation or particles (such as X-rays or neutrons) strikes it

diffractometer 片语

片语

diffractometer a衍射仪

counter diffractometer计数器绕射计

ray diffractometer射线衍射仪

neutron diffractometer[核] 中子衍射仪

Bragg diffractometer布拉格衍射计

focusing diffractometer聚焦衍射计

CCD diffractometerCCD单晶衍射仪

electron diffractometer电子衍射谱仪

optical diffractometer光衍射计

diffractometer 例句

英汉例句

  • this paper introduces x-ray diffractometer application of petroleum geology and petroleum project in jiangsu oilfield, and geological meaning of petroleum exploration and production.

    介绍了x射线衍射仪在江苏油田石油地质、石油工程的应用以及对石油勘探和开发的地质意义。

  • this paper introduces a neutron diffractometer system with three detectors in which the microcomputer is applied to control instruments, collect information and process data.

    本系统介绍了用微型计算机进行运行控制和信息采集及处理的三探头中子粉末衍射仪系统。

  • the products were well-characterized by x-ray diffractometer (xrd) and scanning electron microscope(sem).

    所得产物用x射线衍射仪(xrd)和扫描电子显微镜(sem)进行了表征。

  • retrogradation characteristics of instant wet rice noodle during storage were studied by means of x-ray polycrystal diffractometer and texturenmeter.

    利用x射线多晶衍射仪和质构仪对方便湿米粉存放过程的特性进行了研究。

  • methods: study on the microstructure of indigo naturals with scanning electron microscope (sem) and x ray diffractometer (xrd) were carried out.

    方法:通过扫描电子显微镜(sem)和x衍射(xrd)方法,对青黛的微观结构进行了研究。

  • macro examination, metallographic microscope, microhardness tester and x ray diffractometer were utilized to study the failure reasons for connecting rode bearing bush of automobile engine.

    采用宏微观检验、显微硬度测定、x射线衍射等方法对汽车发动机连桿轴瓦的失效进行了分析。

  • analysis and removal of the troubles in cooling water system of vd_1a x_ray diffractometer were introduced in this paper with an example demonstration.

    介绍了岛津vd_1a型x射线衍射仪冷却循环水系统的故障分析及排除方法。

  • five crystal structures are determined by ccd diffractometer after the single crystals were grown by slow evaporation at room temperature.

    用溶剂自然挥发法培养了五个单晶,并采用ccd单晶衍射仪测定了它们的晶体结构。

  • the holistic design and hardware components of data acquisition system for high resolution powder diffractometer based on china advanced research reactor(carr) were introduced.

    介绍了中国先进研究堆(carr)旁高分辨粉末衍射仪数据采集系统的整体设计和硬件组成,阐述了各单元电路的结构和设计。

  • the product of fsp is characterized by transmission electron microscopy (tem) and x-ray powder diffractometer (xrd).

    通过透射电镜(tem)和x-射线衍射仪(xrd)对所得片状银粉产物进行了表征。

  • the hardness gradient, depth , microstructure and phases of nitrided layers were measured with microhardness apparatus, microcopy and x-ray diffractometer .

    利用显微硬度计、金相显微镜和x射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。

  • the effect of si on the crystal lattice parameters, lattice volume and crystal defects of the eutectic cementite in malleable cast iron has been studied by using x ray diffractometer and tem.

    采用x-射线衍射仪、透射电镜研究了可锻铸铁白口组织中硅对共晶渗碳体点阵参数、晶胞体积及晶体缺陷的影响。

  • a part of the simulation and optimization results on the neutron diffractometer for strain measurements is introduced in this paper.

    本文报道了应力测量专用中子衍射谱仪的部分模拟和优化工作。

  • result for x-ray diffractometer test indicates that no oxidization occurred during the spraying process.

    射线衍射分析结果表明冷喷涂过程中,无氧化现象发生。

  • the product was analyzed by using x-ray diffractometer and electronic microscope and the dispersity in organic solvents was determined.

    对产品进行了x-射线衍射和电镜分析,并检测了在有机溶剂中的分散性。

  • the diluting mechanism of organic and inorganic diluents for porcelain clay containing montmorillonite slip have been explored by x-ray diffractometer and transmission electron microscope.

    本文还利用x-射线衍射仪,透射电镜等测试手段,探讨了有机、无机稀释剂对含蒙脱石瓷砂泥浆的稀释机理。

  • the principle of x-ray diffractometer method of macrostress measurement is described in this paper.

    本文叙述了使用x射线衍射仪法测量宏观应力的原理。

  • the structural properties of the films were analyzed by x ray photo electron spectroscopy (xps), x ray diffractometer (xrd) and atomic force microscope (afm).

    使用x射线光电子能谱仪(xps)、x射线衍射仪(xrd)、原子力显微镜(afm)对薄膜的结构进行了分析。

相关热词