Variable Angle spectroscopic ellipsometry (VASE) is a instrument for measuring optical film refractive index and thickness and is a powerful technique for research on new materials and processes.
可变角度的光谱椭偏仪(VASE)是一种测量光学薄膜折射率和厚度的仪器,它对于新材料和新过程的研究是一种强有力的技术手段。
A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced.
探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性。
Through the establishment of different physical and dispersion models, the effects of the surface and interface on spectroscopic ellipsometry were inspected.
通过建立不同的物理和色散模型,分别考察了薄膜表面和界面的椭偏效应。