片语

test vector translation测试向量转换

Test Vector Index测试矢量索引

test vector generation测试向量生成

test vector reordering测试矢量顺序

Parallel Test Vector并行测试向量

test vector generatorTest vector generator is a program used to automatically generate test data for use in automated testing of software. This can generate many individual test vector

test vector optimization测试集优化

STIL test vectorSTIL测试向量

英汉例句

• This paper studies a test vector generation algorithm for digital circuits which can locate the component faults.

  结合一个实际电路，研究了一种可把数字电路故障定位到器件级的测试向量生成算法。

• This article gives a new BIST test generator design for transient current testing, this design not only produces needed test vector pairs but also has an advantage of low hardware overheads.

  本文给出了一种新型的瞬态电流测试BIST测试生成器设计方案，该设计可以产生所需要的测试向量对，同时具有硬件开销小的优点。

• The fault simulator is an important part of a simulating based automatic test generating system, and its performance greatly affects the quality of the gained test vector set.

  故障模拟器是基于模拟算法的测试生成系统的重要组成部分，其性能优劣直接影响测试集的各项指标。

• This paper introduces the special software and flow converted from VCD test vector to STIL test vector, which is based of SAPPHIRE SOC test System.

  本文基于SAPPHIRE集成电路测试系统，介绍了自行开发的从VCD测试向量到STIL测试向量的转换软件及流程。

• The test vectors of some sub-scan chains generate by controllable LFSR when these chains only need to update test vector and do not need to shift out test responses.

  当某个子扫描链的测试向量需要更新且又不需要移出其测试响应时，其测试向量由可控LFSR产生。

• Base on the existing synchronous sequential circuits fault simulator-HOPE, the test vector generation method of sequential circuits based on ant algorithm is systematically researched firstly.

  本文在同步时序电路故障模拟器—HOPE的基础上，率先对基于蚂蚁算法的时序电路测试矢量生成方法作了系统的开拓性研究。

• During the period of employing IEEE1445 to resolve the problem of fault diagnose, the test vector set's reduction is a hard problem to the entire developing process.

  在利用IEEE1445标準来完成电路板的故障诊断时，矢量的约简是整个测试程序开发过程中的一个难点。

• To satisfy specialized demands of test vector in digital circuit simulation and fault diagnosis, we develop a software package「Dragging Mouse to Generate Test Vector」by VB5.0.

  针对数字系统仿真、故障诊断中对测试向量的特殊要求，利用VB 5 0开发出了拖拽鼠标快速生成测试向量的软件包。

• A new BIST structure with the method of test vector generation based on a controlled LFSR is proposed.

  本文提出了一种基于受控线性反馈移位寄存器（LFSR）进行内建自测试的结构及其测试矢量生成方法。

• Circuits described are modeled to behavior sets after abstraction, and can be replaced by their behavior sets during functional test vector generation procedures.

  通过抽象，电路可以规范为行为集，并代替电路本身进行功能测试向量的生成。

• The algorithm used backward implication in improved FAN algorithm to activate fault and mapped test vector space to the chaotic space, adopted chaotic search to find out the suitable testing pairs.

  该算法利用改进FAN算法的反向蕴涵部分激活故障并将测试向量空间映射到混沌空间，采用混沌搜索来确定未确定的测试向量位。

• A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors.

  本文还提出了一种面向最小相关度多捕获结构的测试向量生成算法。

• Controllable LFSR can adjust test vector sequence generated by original LFSR through control codes which stored in the ate or ROM.

  可控LFSR可以通过一些控制码对LFSR的原始产生顺序进行调整，这些控制码存储在ate中或ROM中。

• Experimental results show that this approach is efficient and automated in test vector translation.

  实验结果表明，该周期化方法是一种行之有效的测试向量转换方法。

• For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.

  为进一步降低测试功耗及测试应用时间，提出一种基于扫描链阻塞技术且针对非相容测试向量的压缩方法。